21st International Scanning Probe Microscopy (ISPM) Conference
May 26, 2019 - May 29, 2019
International Scanning Probe Microscopy
The International Scanning Probe Microscopy (ISPM) Conference in Louvain-la-Neuve 2019 is the 21st in a continuing series of international meetings featuring research on scanning probe microscopy (SPM), sensors, and nanostructures that began in Seattle in 1999 and was followed by the annual conferences held in US, Europe, Asia, and South America. It is aimed at researchers working on the development of scanning probe microscopy techniques, as well as users of scanning probe microscopes from all scientific and industrial disciplines such as materials science, basic physics, life sciences, semiconductor industry and energy industry.